Henniker Scientific Ltd.

Henniker Scientific Ltd.
Cavendish House
Birchwood park
Warrington
Cheshire
WA3 6BU
United Kingdom

Tel: +44 (0) 1925 811 254
Fax: +44 (0) 1925 800 035

Components, instruments & systems for UHV, thin film deposition, surface, plasma & gas analysis. - Quadrupole Mass Spectrometers - Ion/Electron/UV/X-Ray Sources - E-Beam & Thermal Evaporators - Plasma Diagnostic Instruments - Custom Systems

The MAX-SIMS quadrupole mass spectrometer is a high performance bolt-on instrument for static SIMS, dynamic SIMS, SNMS and depth profiling applications.

Microvision2 is a TPD specific quadrupole mass spectrometer having the fastest, most accurate measurement characterists over the entire dynamic measurement range.

Our custom, multi-technique UHV systems combine a wide range of thin film deposition/growth and UHV surface analysis techniques into a single, versatile system that doesn't cost the earth.

The RS 40B1 UHV X-ray source is a new, high intensity twin anode Al/Mg UHV X-ray source optimised for XPS experiments.

Low cost, high intensity UV source for ultraviolet photoelectron spectroscopy. Used & specified by many OEM manufacturers worldwide.

Compact single and multi-cell E-beam evaporator for thin film MBE growth applications.

The IS 40E1 scanning ion source is a two lens extractor type focussed ion gun for depth profiling in SIMS/XPS/ESCA applications.

The ion flood source IS 40C1 is a compact, easy-to-use UHV extractor type ion source for sample surface cleaning.

The ES40C1 is a low cost focussed electron source for AES, EELS and electron pulse/desorption experiments.

The FS 40A1 is a compact, easy to use and reliable electron flood gun source for charge neutralisation of insulators or semiconductors in XPS/AES and SIMS applications.

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