Sunday, October 31, 2010

Scanning-Slit Laser Beam Profiler - Ophir Laser Measurement Group

Ophir Optronics Ltd
PO Box 45021
PO Box 45021
Jerusalem
91450
Israel

Tel: 00-972-25-484444
Fax: 00-972-25-822338

All lasers degrade over time. Regular measurement ensures specs are met. Photon Inc.’s NanoScan is capable of measuring beam size and position to sub-micron resolution.

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It provides NIST-traceable accuracy and precision for measuring CW and kHz pulsed laser beams from UV to far IR. Scanning-slit technology makes it easy because it can measure even high power beams without the need for complicated attenuation schemes. Download the white paper “IR and Pulsed Laser Measurements: Measure Beams Directly.”

http://www.ophiropt.com/laser-measurement-instruments/about/enews-bs

Ophir Laser Measurement Group
60 West 1000 North
Logan, UT 84321 USA
+1 435-753-3729
www.ophirot.com/laser-measurement
sales@ophir-spiricon.com

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